IEEE - Institute of Electrical and Electronics Engineers, Inc. - Latticed Corner Detector Driven by Best-Fit Differentials in Arbitrary Rational Directions

2013 7th Asia Modelling Symposium (AMS 2013)

Author(s): Jianhui Li ; Lihong Ma ; Xingjun Tan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2013
Conference Location: Hong Kong, China
Conference Date: 23 July 2013
Page(s): 143 - 148
ISBN (Electronic): 978-0-7695-5101-2
DOI: 10.1109/AMS.2013.28
Regular:

In this paper, we suggest a new corner detector based on latticed differentials in arbitrary rational directions and propose a response-suppression in the neighborhood of an extreme. The... View More

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