IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effect of cooling on the probe system sensitivity for low signal strength RFI problems

2013 IEEE International Symposium on Electromagnetic Compatibility (EMC 2013)

Author(s): Guang-Hua Li ; Wei Huang ; David Pommerenke
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2013
Conference Location: Denver, CO, USA
Conference Date: 5 August 2013
Page(s): 134 - 137
ISBN (CD): 978-1-4799-0409-9
ISBN (Electronic): 978-1-4799-0410-5
ISBN (Paper): 978-1-4799-0408-2
ISSN (Electronic): 2158-1118
ISSN (Paper): 2158-110X
DOI: 10.1109/ISEMC.2013.6670396
Regular:

Only highly sensitive probe systems can detect the weak field strengths that cause radio-frequency-interference (RFI) problems typically found within cell phones. The sensitivity of the... View More

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