IEEE - Institute of Electrical and Electronics Engineers, Inc. - Register Transfer Level Workflow for Application and Evaluation of Soft Error Mitigation Techniques

2013 16th Euromicro Conference on Digital System Design

Author(s): Filipe Sousa ; Francis Anghinolfi ; Joao Canas Ferreira
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2013
Conference Location: Los Alamitos, CA, USA
Conference Date: 4 September 2013
Page(s): 829 - 835
ISBN (Electronic): 978-1-4799-2978-8
DOI: 10.1109/DSD.2013.92
Regular:

Digital circuits exposed to environments with high levels of radiation, such as those found in High Energy Physics experiments, are prone to Single Event Upsets. These upsets impact the... View More

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