IEEE - Institute of Electrical and Electronics Engineers, Inc. - Virtual TMR Schemes Combining Fault Tolerance and Self Repair

2013 16th Euromicro Conference on Digital System Design

Author(s): T. Koal ; M. Ulbricht ; H. T. Vierhaus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2013
Conference Location: Los Alamitos, CA, USA
Conference Date: 4 September 2013
Page(s): 235 - 242
ISBN (Electronic): 978-1-4799-2978-8
DOI: 10.1109/DSD.2013.34
Regular:

Nano-electronic circuits and systems with a minimum feature size of 45 nm and below exhibit an increasing variety of defect and fault mechanisms. Their rising sensitivity to radiation and coupling... View More

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