IEEE - Institute of Electrical and Electronics Engineers, Inc. - Concurrent Error Detection in Multipliers by Using Reduced Wordlength Multiplication and Logarithms

2013 16th Euromicro Conference on Digital System Design

Author(s): Alexander Uhl ; Juergen Becker
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2013
Conference Location: Los Alamitos, CA, USA
Conference Date: 4 September 2013
Page(s): 129 - 135
ISBN (Electronic): 978-1-4799-2978-8
DOI: 10.1109/DSD.2013.22
Regular:

Checking multiplication by using logarithms has already been proposed in literature but until now it has not been used widely in practice nor have different implementations been evaluated or... View More

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