IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic Selection of Binarization Method for Robust OCR

2013 12th International Conference on Document Analysis and Recognition (ICDAR)

Author(s): T. Chattopadhyay ; V. Ramu Reddy ; Utpal Garain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2013
Conference Location: Washington, DC, USA
Conference Date: 25 August 2013
Page(s): 1,170 - 1,174
ISBN (Electronic): 978-0-7695-4999-6
ISSN (Paper): 1520-5363
DOI: 10.1109/ICDAR.2013.237
Regular:

Many algorithms are now available for doing the same task (e.g. binarization, page segmentation, character recognition, etc.) in document image analysis (DIA) and choosing a particular... View More

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