IEEE - Institute of Electrical and Electronics Engineers, Inc. - Error Detection in Highly Inflectional Languages

2013 12th International Conference on Document Analysis and Recognition (ICDAR)

Author(s): Naveen Sankaran ; C. V. Jawahar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2013
Conference Location: Washington, DC, USA
Conference Date: 25 August 2013
Page(s): 1,135 - 1,139
ISBN (Electronic): 978-0-7695-4999-6
ISSN (Paper): 1520-5363
DOI: 10.1109/ICDAR.2013.230
Regular:

Error detection in OCR output using dictionaries and statistical language models (SLMs) have become common practice for some time now, while designing post-processors. Multiple strategies have... View More

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