IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust Symbol Localization Based on Junction Features and Efficient Geometry Consistency Checking

2013 12th International Conference on Document Analysis and Recognition (ICDAR)

Author(s): The Anh Pham ; Mathieu Delalandre ; Sabine Barrat ; Jean-Yves Ramel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2013
Conference Location: Washington, DC, USA
Conference Date: 25 August 2013
Page(s): 1,083 - 1,087
ISBN (Electronic): 978-0-7695-4999-6
ISSN (Paper): 1520-5363
DOI: 10.1109/ICDAR.2013.216
Regular:

This paper presents a new approach for symbol localization in line-drawing images using junction features and geometry consistency checking. The proposed system first detects junction points, and... View More

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