IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic Enhancement and Binarization of Degraded Document Images

2013 12th International Conference on Document Analysis and Recognition (ICDAR)

Author(s): Jon Parker ; Ophir Frieder ; Gideon Frieder
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2013
Conference Location: Washington, DC, USA
Conference Date: 25 August 2013
Page(s): 210 - 214
ISBN (Electronic): 978-0-7695-4999-6
ISSN (Paper): 1520-5363
DOI: 10.1109/ICDAR.2013.49
Regular:

Often documents of historic significance are discovered in a state of disrepair. Such documents are commonly scanned to simultaneously archive and publicize a discovery. Converting the information... View More

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