IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Objective Method to Evaluate Stroke-Width Measures for Binarized Documents

2013 12th International Conference on Document Analysis and Recognition (ICDAR)

Author(s): Marte A. Ramirez-Ortegon ; Volker Margner ; Raul Rojas ; Erik Cuevas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2013
Conference Location: Washington, DC, USA
Conference Date: 25 August 2013
Page(s): 175 - 179
ISBN (Electronic): 978-0-7695-4999-6
ISSN (Paper): 1520-5363
DOI: 10.1109/ICDAR.2013.42
Regular:

In this article, we propose an objective method to evaluate stroke-width measures. With this aim, we discuss the relevance of features based on the stroke width for document analysis. Then, we... View More

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