IEEE - Institute of Electrical and Electronics Engineers, Inc. - Oscillation Built-In-Self-Test for ADC linearity testing in deep submicron CMOS technology

2013 5th Asia Symposium on Quality Electronic Design (ASQED)

Author(s): Koay Soon Chan ; Nuzrul Fahmi Nordin ; Kim Chon Chan ; Terk Zyou Lok ; Chee Wai Yong ; Adam Osseiran
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2013
Conference Location: Penang, Malaysia
Conference Date: 26 August 2013
Page(s): 208 - 215
ISBN (CD): 978-1-4799-1312-1
ISBN (Electronic): 978-1-4799-1314-5
DOI: 10.1109/ASQED.2013.6643589
Regular:

This paper proposes an Oscillation BIST (OBIST) that is meant to test ADCs fabricated in sub 100nm processes. The design is intended to be capable of testing a 10-bit ADC that was designed in 40nm... View More

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