IEEE - Institute of Electrical and Electronics Engineers, Inc. - The blame game in meeting room ASR: An analysis of feature versus model errors in noisy and mismatched conditions

ICASSP 2013 - IEEE International Conference on Acoustics, Speech and Signal Processing

Author(s): Sree Hari Krishnan Parthasarathi ; Shuo-Yiin Chang ; Jordan Cohen ; Nelson Morgan ; Steven Wegmann
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2013
Conference Location: Vancouver, BC, Canada
Conference Date: 26 May 2013
Page(s): 6,758 - 6,762
ISBN (Electronic): 978-1-4799-0356-6
ISSN (Paper): 1520-6149
DOI: 10.1109/ICASSP.2013.6638970
Regular:

Given a test waveform, state-of-the-art ASR systems extract a sequence of MFCC features and decode them with a set of trained HMMs. When this test data is clean, and it matches the condition used... View More

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