IEEE - Institute of Electrical and Electronics Engineers, Inc. - Toeplitz matrix based sparse error correction in system identification: Outliers and random noises

ICASSP 2013 - IEEE International Conference on Acoustics, Speech and Signal Processing

Author(s): Weiyu Xu ; Er-Wei Bai ; Myung Cho
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2013
Conference Location: Vancouver, BC, Canada
Conference Date: 26 May 2013
Page(s): 6,640 - 6,644
ISBN (Electronic): 978-1-4799-0356-6
ISSN (Paper): 1520-6149
DOI: 10.1109/ICASSP.2013.6638946
Regular:

In this paper, we consider robust system identification under sparse outliers and random noises. In our problem, system parameters are observed through a Toeplitz matrix. All observations are... View More

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