IEEE - Institute of Electrical and Electronics Engineers, Inc. - A classification scheme for ‘high-dimensional-small-sample-size’ data using soda and ridge-SVM with microwave measurement applications

ICASSP 2013 - IEEE International Conference on Acoustics, Speech and Signal Processing

Author(s): Yinan Yu ; Tomas McKelvey ; Sun-Yuan Kung
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2013
Conference Location: Vancouver, BC, Canada
Conference Date: 26 May 2013
Page(s): 3,542 - 3,546
ISBN (Electronic): 978-1-4799-0356-6
ISSN (Paper): 1520-6149
DOI: 10.1109/ICASSP.2013.6638317
Regular:

The generalization performance of SVM-type classifiers severely suffers from the `curse of dimensionality'. For some real world applications, the dimensionality of the measurement is sometimes... View More

Advertisement