IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design of non-destructive single-sawtooth pulse based readout for STT-RAM by NVM-SPICE

2012 12th Annual Non-Volatile Memory Technology Symposium (NVMTS)

Author(s): Yuhao Wang ; Yang Shang ; Hao Yu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2012
Conference Location: Singapore, Singapore
Conference Date: 31 October 2012
Page(s): 68 - 72
ISBN (Electronic): 978-1-4673-2848-7
ISBN (Paper): 978-1-4673-2847-0
DOI: 10.1109/NVMTS.2013.6632865
Regular:

Spin-transfer torque random access memory (STT-RAM) is one promising candidate for future non-volatile memory based computing, because of its fast access time, high integration density and... View More

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