IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design and realization of a voltage detector based on current comparison in a 40nm technology

2013 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC)

Author(s): S. Y. Wu ; W. B. Chen ; N. Ning ; J. Li ; Y. Liu ; Q. Yu
Sponsor(s): IEEE Electron Devices Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2013
Conference Location: Hong Kong, China
Conference Date: 3 June 2013
Page(s): 1 - 2
ISBN (Electronic): 978-1-4673-2523-3
DOI: 10.1109/EDSSC.2013.6628058
Regular:

A design of low-power voltage detector (VD) based on current comparison technology is presented. This VD samples the power supply voltage and converts the sampled voltage to a current which will... View More

Advertisement