IEEE - Institute of Electrical and Electronics Engineers, Inc. - Single-cycle, pulse-shaped critical path monitor in the POWER7+ microprocessor

2013 IEEE International Symposium on Low Power Electronics and Design (ISLPED)

Author(s): Alan J. Drake ; Michael S. Floyd ; Richard L. Willaman ; Derek J. Hathaway ; Joshua Hernandez ; Crystal Soja ; Marshall D. Tiner ; Gary D. Carpenter ; Robert M. Senger
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2013
Conference Location: Beijing, China
Conference Date: 4 September 2013
Page(s): 193 - 198
ISBN (CD): 978-1-4799-1234-6
ISBN (Electronic): 978-1-4799-1235-3
DOI: 10.1109/ISLPED.2013.6629293
Regular:

A 32nm SOI critical path monitor (CPM) that can provide timing measurements to a Digital PLL for dynamic frequency adjustments in the 8-core POWER7+™ microprocessor is described. The CPM... View More

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