IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multi-directional illumination for automatic flaw detection on photographic film: The importance of being many

2013 Colour and Visual Computing Symposium (CVCS)

Author(s): Giorgio Trumpy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2013
Conference Location: Gjovik, Norway
Conference Date: 5 September 2013
Page(s): 1 - 5
ISBN (Electronic): 978-1-4799-0609-3
DOI: 10.1109/CVCS.2013.6626286
Regular:

Dark-field illumination is a useful optical method to emphasize structures and impurities in a sample; hence, it can be useful to pinpoint flaws on photographic film. However, in case of... View More

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