IEEE - Institute of Electrical and Electronics Engineers, Inc. - Big Visible Testing

2013 Agile Conference (AGILE)

Author(s): Claire Moss
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2013
Conference Location: Nashville, TN, USA
Conference Date: 5 August 2013
Page(s): 94 - 100
ISBN (Electronic): 978-0-7695-5076-3
DOI: 10.1109/AGILE.2013.15
Regular:

Software testing is a key part of software development, so it's important that the testers be as effective as possible. Especially in fast-feedback agile teams, software testers must respond to... View More

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