IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability of discrete power semiconductor packages and systems — D2Pak and CanPAK in comparison

2013 15th European Conference on Power Electronics and Applications (EPE)

Author(s): Kay Hofmann ; Christian Herold ; Menia Beier ; Josef Lutz ; Jens Friebe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2013
Conference Location: Lille, France
Conference Date: 2 September 2013
Page(s): 1 - 10
ISBN (Electronic): 978-1-4799-0116-6
DOI: 10.1109/EPE.2013.6634611
Regular:

The reliability of discrete power semiconductor packages is getting more and more important in regard to the increasing number of power applications in the low power range. Therefore it is... View More

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