IEEE - Institute of Electrical and Electronics Engineers, Inc. - Genetic analysis of leaf expansion trait in Brassica rapa L. ssp. chinensis (L.) Hanelt

2013 7th International Conference on Systems Biology (ISB)

Author(s): Jian-ming Han ; Rui-ling Wang ; Yan-wei Cheng ; Xue-bin Li ; Chao-jun He
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2013
Conference Location: Huangshan, China
Conference Date: 23 August 2013
Page(s): 1 - 5
ISBN (Electronic): 978-1-4799-1389-3
ISSN (Electronic): 2325-0712
ISSN (Paper): 2325-0704
DOI: 10.1109/ISB.2013.6623783
Regular:

Brassica rapa L. ssp. chinensis (L.) Hanelt is an important vegetable in eastern Asia. Its leaf area is one of main factor of influencing on the yield of individual plant. To reveal the mechanism... View More

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