IEEE - Institute of Electrical and Electronics Engineers, Inc. - A comparative study of voltage/frequency scaling in NoC

2013 IEEE International Conference on Electro/Information Technology (EIT)

Author(s): Saeeda Usman ; Samee U. Khan ; Sikandar Khan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2013
Conference Location: Rapid City, SD, USA
Conference Date: 9 May 2013
Page(s): 1 - 5
ISBN (CD): 978-1-4673-5207-9
ISBN (Electronic): 978-1-4673-5208-6
ISSN (Electronic): 2154-0373
ISSN (Paper): 2154-0357
DOI: 10.1109/EIT.2013.6632716
Regular:

Voltage and frequency is dynamically scaled to produce energy efficient multi-core network-on-chip (NoC). A detailed analysis of the techniques employed for this purpose are studied and based on... View More

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