IEEE - Institute of Electrical and Electronics Engineers, Inc. - Model-based fault diagnosis of a DC-DC boost converters using hidden Markov model

2013 IEEE International Conference on Electro/Information Technology (EIT)

Author(s): M. Hadi Hafizi ; Afshin Izadian
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2013
Conference Location: Rapid City, SD, USA
Conference Date: 9 May 2013
Page(s): 1 - 4
ISBN (CD): 978-1-4673-5207-9
ISBN (Electronic): 978-1-4673-5208-6
ISSN (Electronic): 2154-0373
ISSN (Paper): 2154-0357
DOI: 10.1109/EIT.2013.6632695
Regular:

This paper introduces a hidden Markov model (HMM)-based fault diagnosis technique for DC-DC boost converter. Four HMMs are trained to model parameter variations in the power converters. Each HMM... View More

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