IEEE - Institute of Electrical and Electronics Engineers, Inc. - Intelligent condition based monitoring of rotating machines using sparse auto-encoders

2013 IEEE Conference on Prognostics and Health Management (PHM)

Author(s): Nishchal K. Verma ; Vishal Kumar Gupta ; Mayank Sharma ; Rahul Kumar Sevakula
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2013
Conference Location: Gaithersburg, MD, USA
Conference Date: 24 June 2013
Page(s): 1 - 7
ISBN (CD): 978-1-4673-5722-7
ISBN (Electronic): 978-1-4673-5723-4
DOI: 10.1109/ICPHM.2013.6621447
Regular:

Support Vector Machine (SVM) has been very popular for use in machine fault diagnosis as classifier. In most of the complex machine learning problems, the main challenge lies in finding good... View More

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