IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test point selection based on functional simulation and FMMEA for an electronic system on PHM

2013 IEEE Conference on Prognostics and Health Management (PHM)

Author(s): Xufei Wang ; Zhongqun Li ; Shunong Zhang ; Jiaming Liu ; Cong Shao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2013
Conference Location: Gaithersburg, MD, USA
Conference Date: 24 June 2013
Page(s): 1 - 6
ISBN (CD): 978-1-4673-5722-7
ISBN (Electronic): 978-1-4673-5723-4
DOI: 10.1109/ICPHM.2013.6621444
Regular:

Test points are observation points extracting system information, so the selection of test points is a key step for electronic systems on PHM. Test points should be able to characterize the fault... View More

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