IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sampling schedule optimization of embedded wireless sensors for degradation monitoring

2013 IEEE Conference on Prognostics and Health Management (PHM)

Author(s): Petek Yontay ; Rong Pan ; O. Arda Vanli
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2013
Conference Location: Gaithersburg, MD, USA
Conference Date: 24 June 2013
Page(s): 1 - 6
ISBN (CD): 978-1-4673-5722-7
ISBN (Electronic): 978-1-4673-5723-4
DOI: 10.1109/ICPHM.2013.6621414
Regular:

Inexpensive wireless sensors can be embedded in structural materials to detect defects. These sensors provide in-situ diagnosis of the system's health, thus invaluable information to decision... View More

Advertisement