IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design of an advanced modular automated evaluation system for experimental high power Si and SiC SGTOs

2013 IEEE 40th International Conference on Plasma Sciences (ICOPS)

Author(s): Kevin Lawson ; Shelby Lacouture ; Stephen Bayne ; Michael Giesselmann ; Heather O'Brien ; Aderinto Ogunniyi ; Charles J. Scozzie
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2013
Conference Location: San Francisco, CA, USA
Conference Date: 16 June 2013
Page(s): 1
ISBN (Electronic): 978-1-4673-5171-3
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.2013.6634860
Regular:

An advanced evaluation system for experimental high power silicon (Si) and silicon carbide (SiC) Super Gate Turn Off Thyristors (SGTOs) with custom data acquisition and characterization... View More

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