IEEE - Institute of Electrical and Electronics Engineers, Inc. - Electrical breakdown phenomena involving material interfaces

2013 IEEE 40th International Conference on Plasma Sciences (ICOPS)

Author(s): Harold P. Hjalmarson ; Fred J. Zutavern ; Alan Mar ; Kenneth M. Williamson ; Jane M. Lehr ; Andrew C. Pineda
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2013
Conference Location: San Francisco, CA, USA
Conference Date: 16 June 2013
Page(s): 1
ISBN (Electronic): 978-1-4673-5171-3
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.2013.6633500
Regular:

Summary form only given. Material interfaces often reveal complicated and interesting phenomena and physics during electrical breakdown. In this talk, the physics at interfaces in two specific... View More

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