IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reachability Graph Based Hierarchical Test Generation for Network Protocols Modeled as Parallel Finite State Machines

2013 22nd International Conference on Computer Communication and Networks (ICCCN 2013)

Author(s): Jiangyuan Yao ; Zhiliang Wang ; Xia Yin ; Xingang Shi ; Jianping Wu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2013
Conference Location: Nassau, Bahamas
Conference Date: 30 July 2013
Page(s): 1 - 9
ISBN (CD): 978-1-4673-5774-6
ISBN (Electronic): 978-1-4673-5775-3
DOI: 10.1109/ICCCN.2013.6614178
Regular:

Current researches on model-based testing mainly focus on the single component model, such as FSM (Finite State Machine) and EFSM (Extended FSM). To model and test parallelism and concurrency... View More

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