IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reachability Graph Based Hierarchical Test Generation for Network Protocols Modeled as Parallel Finite State Machines
2013 22nd International Conference on Computer Communication and Networks (ICCCN 2013)
Author(s): | Jiangyuan Yao ; Zhiliang Wang ; Xia Yin ; Xingang Shi ; Jianping Wu |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 July 2013 |
Conference Location: | Nassau, Bahamas |
Conference Date: | 30 July 2013 |
Page(s): | 1 - 9 |
ISBN (CD): | 978-1-4673-5774-6 |
ISBN (Electronic): | 978-1-4673-5775-3 |
DOI: | 10.1109/ICCCN.2013.6614178 |
Regular:
Current researches on model-based testing mainly focus on the single component model, such as FSM (Finite State Machine) and EFSM (Extended FSM). To model and test parallelism and concurrency... View More