IEEE - Institute of Electrical and Electronics Engineers, Inc. - A study on test automation of IVN of intelligent vehicle using model-based testing

2013 Fifth International Conference on Ubiquitous and Future Networks (ICUFN)

Author(s): Kabsu Han ; Insick Son ; Jeonghun Cho
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2013
Conference Location: Da Nang, Vietnam
Conference Date: 2 July 2013
Page(s): 123 - 128
ISBN (Electronic): 978-1-4673-5990-0
ISSN (Paper): 2165-8528
DOI: 10.1109/ICUFN.2013.6614794
Regular:

To certify complex functionality of intelligent vehicle, functional testing is critical parts of development process. For practical testing, well-defined test suites which have wide test coverage... View More

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