IEEE - Institute of Electrical and Electronics Engineers, Inc. - Advanced sensors for scanning SQUID microscopy

2013 IEEE 14th International Superconductive Electronics Conference (ISEC 2013)

Author(s): J. R. Kirtley ; G. W. Gibson ; Y.-K.-K Fung ; B. Klopfer ; K. Nowack ; P. A. Kratz ; J.-M Mol ; J. Arpes ; F. Forooghi ; M. E. Huber ; H. Bluhm ; K. A. Moler
Sponsor(s): IEEE Appl. Supercond. Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2013
Conference Location: Cambridge, MA, USA
Conference Date: 7 July 2013
Page(s): 1 - 2
ISBN (CD): 978-1-4673-6369-3
ISBN (Electronic): 978-1-4673-6371-6
DOI: 10.1109/ISEC.2013.6604261
Regular:

As part of a joint Stanford/IBM effort to build a scanning SQUID microscopy user facility at Stanford, we have designed and fabricated three types of scanning SQUID microscope sensors. The first... View More

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