IEEE - Institute of Electrical and Electronics Engineers, Inc. - Testing for poor responsiveness in android applications

2013 1st International Workshop on the Engineering of Mobile-Enabled Systems (MOBS)

Author(s): Shengqian Yang ; Dacong Yan ; Atanas Rountev
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2013
Conference Location: San Francisco, CA, USA
Conference Date: 25 May 2013
Page(s): 1 - 6
ISBN (Electronic): 978-1-4673-6333-4
DOI: 10.1109/MOBS.2013.6614215
Regular:

An important category of defects in Android applications are related to poor responsiveness. When the user interface thread performs expensive operations, the application is sluggish and may fail... View More

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