IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automated Brain Tumor segmentation using novel feature point detector and seeded region growing

2013 36th International Conference on Telecommunications and Signal Processing (TSP)

Author(s): Mangipudi Partha Sarathi ; Mohammed Ahmed Ansari ; Vaclav Uher ; Radim Burget ; Malay Kishore Dutta
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2013
Conference Location: Rome, Italy
Conference Date: 2 July 2013
Page(s): 648 - 652
ISBN (CD): 978-1-4799-0403-7
ISBN (Electronic): 978-1-4799-0404-4
ISBN (Paper): 978-1-4799-0402-0
DOI: 10.1109/TSP.2013.6614016
Regular:

In this paper, we propose a methodology for fully automated Brain Tumor segmentation from T1 weighted contrast enhanced Magnetic Resonance Images. A novel algorithm has been designed to extract... View More

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