IEEE - Institute of Electrical and Electronics Engineers, Inc. - Throughput-coverage characteristics for soft and Partial Frequency Reuse in the LTE downlink

2013 36th International Conference on Telecommunications and Signal Processing (TSP)

Author(s): Slawomir Gajewski
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2013
Conference Location: Rome, Italy
Conference Date: 2 July 2013
Page(s): 199 - 203
ISBN (CD): 978-1-4799-0403-7
ISBN (Electronic): 978-1-4799-0404-4
ISBN (Paper): 978-1-4799-0402-0
DOI: 10.1109/TSP.2013.6613919
Regular:

The paper presents results of simulation and evaluation of throughput-coverage characteristics for the OFDMA-based LTE network with Soft Frequency Reuse or Partial Frequency Reuse. Firstly,... View More

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