IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fundamental limits of identification: Identification rate, search and memory complexity trade-off

2013 IEEE International Symposium on Information Theory (ISIT)

Author(s): Farzad Farhadzadeh ; Frans M. J. Willems ; Sviatoslav Voloshynovskiy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2013
Conference Location: Istanbul, Turkey
Conference Date: 7 July 2013
Page(s): 1,252 - 1,256
ISBN (Electronic): 978-1-4799-0446-4
ISSN (Electronic): 2157-8117
ISSN (Paper): 2157-8095
DOI: 10.1109/ISIT.2013.6620427
Regular:

In this paper, we introduce a new generalized scheme to resolve the trade-off between the identification rate, search and memory complexities in large-scale identification systems. The main... View More

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