IEEE - Institute of Electrical and Electronics Engineers, Inc. - Behavioral synthesis of area-efficient testable designs using interaction between hardware sharing and partial scan

Author(s): M. Potkonjak ; S. Dey ; R.K. Roy
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 1995
Volume: 14
Page Count: 14
Page(s): 1,141 - 1,154
ISSN (Paper): 0278-0070
ISSN (Online): 1937-4151
DOI: 10.1109/43.406715
Regular:

We introduce BETS, a behavioral test synthesis system, for the synthesis of high-throughput, area-efficient testable designs. While hardware sharing is a powerful technique to achieve area... View More

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