IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of noise properties of a class of exact methods of inverting the 2-D exponential radon transform [SPECT application]

Author(s): Xiaochuan Pan ; C.E. Metz
Sponsor(s): IEEE Engineering In Medicine and Biology Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1995
Volume: 14
Page Count: 10
Page(s): 659 - 668
ISSN (Paper): 0278-0062
ISSN (Online): 1558-254X
DOI: 10.1109/42.476107
Regular:

A general approach that the authors proposed elsewhere reveals the intrinsic relationship among methods for inversion of the 2-D exponential Radon transform described by Bellini et al. (1979), by... View More

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