IEEE - Institute of Electrical and Electronics Engineers, Inc. - Keynote: Variation-tolerant adaptive and resilient designs in nanoscale CMOS

2013 19th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC)

Author(s): Vivek De
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2013
Conference Location: Santa Monica, CA, USA, USA
Conference Date: 19 May 2013
ISBN (Paper): 978-1-4673-5956-6
ISSN (Paper): 1522-8681
DOI: 10.1109/ASYNC.2013.35
Regular:

Summary form only given, as follows. Process, voltage and temperature (PVT) variations pose major challenges to achieving energy-efficient performance in multi-core & many-core processors and SoC... View More

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