IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic eye-blink artifact removal method based on EMD-CCA

2013 ICME International Conference on Complex Medical Engineering (CME 2013)

Author(s): M. H. Soomro ; N. Badruddin ; M. Z. Yusoff ; M. A. Jatoi
Sponsor(s): IEEE Syst., Man Cybern. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2013
Conference Location: Beijing, China
Conference Date: 25 May 2013
Page(s): 186 - 190
ISBN (CD): 978-1-4673-2969-9
ISBN (Electronic): 978-1-4673-2971-2
ISBN (Paper): 978-1-4673-2970-5
DOI: 10.1109/ICCME.2013.6548236
Regular:

This research proposes a new hybrid algorithm for automatic removal of eye blink artifact from EEG data based on empirical mode decomposition (EMD) and canonical correlation analysis (CCA). The... View More

Advertisement