IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability analysis of accelerated life-test data from a repairable system

Author(s): M. Guida ; M. Giorgio
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 1995
Volume: 44
Page Count: 10
Page(s): 337 - 346
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/24.387392
Regular:

This paper analyzes accelerating testing of a repairable item modeled by a nonhomogeneous Poisson process with covariates. We extensively analyze a single accelerating variable with two stress... View More

Advertisement