IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new safe-point thinning algorithm based on the mid-crack code tracing

Author(s): F.Y. Shih ; Wai-Tak Wong
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 1995
Volume: 25
Page Count: 8
Page(s): 370 - 378
ISSN (Paper): 0018-9472
ISSN (Online): 2168-2909
DOI: 10.1109/21.364827
Regular:

A new thinning algorithm for binary images, based on the safe-point testing and mid-crack code tracing, is presented. Thinning is treated as the deletion of nonsafe border pixels from the contour... View More

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