IEEE - Institute of Electrical and Electronics Engineers, Inc. - Magnetoresistance of thin-film NiFe devices exhibiting single-domain behavior

Author(s): R.W. Cross ; J.O. Oti ; S.E. Russek ; T. Silva ; Y.K. Kim
Sponsor(s): IEEE Magnetics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 1995
Volume: 31
Page Count: 3
Page(s): 3,358 - 3,360
ISSN (Paper): 0018-9464
ISSN (Online): 1941-0069
DOI: 10.1109/20.490381
Regular:

Rectangular NiFe stripes as small as 1/spl times/5 /spl mu/m were fabricated and characterized as a function of film thickness. Gold current leads were sputtered and patterned onto the stripes so... View More

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