IEEE - Institute of Electrical and Electronics Engineers, Inc. - International comparison of standard capacitors under the Asia/Pacific metrology programme

Author(s): Rae Duk Lee ; Han Jun Kim ; G.W. Small
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 1995
Volume: 44
Page Count: 4
Page(s): 443 - 446
ISSN (Paper): 0018-9456
ISSN (Online): 1557-9662
DOI: 10.1109/19.377875
Regular:

An international comparison of standard capacitors has been carried out under the auspices of the Asia/Pacific Metrology Programme (APMTP) from 1991 to 1994. The national standards laboratories of... View More

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