IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evaluating Reliability-Testing Usage Models

2012 IEEE 36th Annual Computer Software and Applications Conference - COMPSAC 2012

Author(s): Bo Wan ; Bochmann, G.V. ; Jourdan, G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2012
Conference Location: Izmir, Turkey, Turkey
Conference Date: 16 July 2012
Page(s): 129 - 137
ISBN (Paper): 978-1-4673-1990-4
ISBN (Online): 978-0-7695-4736-7
ISSN (Paper): 0730-3157
ISSN (Online): 0730-3157
DOI: 10.1109/COMPSAC.2012.23
Regular:

Testing the reliability of an application usually requires a good usage model that accurately captures the likely sequences of inputs that the application will receive from the environment. Markov... View More

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