IEEE - Institute of Electrical and Electronics Engineers, Inc. - A facet ensemble approach for evaluation of array performance in ultrasonic NDE

Author(s): J.P. McGarrity ; G. Hayward ; D.J. Powell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1994
Volume: 41
Page Count: 7
Page(s): 19 - 25
ISSN (Paper): 0885-3010
DOI: 10.1109/58.265816
Regular:

The use of ultrasonic array systems, in conjunction with a synthetic aperture focusing technique (SAFT) has recognized potential for flaw characterization in nondestructive evaluation (NDE).... View More

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