IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measurement of capacitance transients with attoFarad resolution in a microwave varactor diode after Co/sup 60/ irradiation

Author(s): J. Scarpulla ; A.M. Young ; J. Chen
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1994
Volume: 41
Page Count: 9
Page(s): 2,502 - 2,510
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/23.340608
Regular:

A high resolution measurement system was constructed to investigate transient capacitance changes in varactor diodes after exposure to Co/sup 60/ photons. These capacitance transients, while... View More

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