IEEE - Institute of Electrical and Electronics Engineers, Inc. - Noise properties of biepitaxial HTS junctions

Author(s): S.G. Hammond ; Y. He ; C.M. Muirhead ; P. Wu ; M.S. Colclough ; K. Char
Sponsor(s): Council on Superconductivity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 1993
Volume: 3
Page Count: 2
Page(s): 2,319 - 2,320
ISSN (Electronic): 1558-2515
ISSN (Paper): 1051-8223
DOI: 10.1109/77.233438
Regular:

The authors have measured the voltage noise across a biepitaxial junction at both low current, where the noise is dominated by critical current fluctuations, and at high current, where the noise... View More

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