IEEE - Institute of Electrical and Electronics Engineers, Inc. - IC failure analysis: techniques and tools for quality reliability improvement

Author(s): J.M. Soden ; R.E. Anderson
Sponsor(s): IEEE Publication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 1993
Volume: 81
Page Count: 13
Page(s): 703 - 715
ISSN (Paper): 0018-9219
ISSN (Online): 1558-2256
DOI: 10.1109/5.220902
Regular:

The role of failure analysis is discussed. Failure analysis techniques and tools, including electrical measurements, optical microscopy, thermal imaging analysis, electron beam techniques, light... View More

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