IEEE - Institute of Electrical and Electronics Engineers, Inc. - A novel behavioral testability measure

Author(s): Chung-Hsing Chen ; D.G. Saab
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1993
Volume: 12
Page Count: 11
Page(s): 1,960 - 1,970
ISSN (Paper): 0278-0070
ISSN (Online): 1937-4151
DOI: 10.1109/43.251159
Regular:

In this paper a new approach, called BETA, for computing testability is presented. The approach is based on analyzing the circuit's behavioral description: the control flow graph (CFG). Based on... View More

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