IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sequential model criticism in probabilistic expert systems

Author(s): R.G. Cowell ; A.P. Dawid ; D.J. Spiegelhalter
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 1993
Volume: 15
Page Count: 11
Page(s): 209 - 219
ISSN (CD): 2160-9292
ISSN (Paper): 0162-8828
DOI: 10.1109/34.204903
Regular:

Probabilistic expert systems based on Bayesian networks require initial specification of both qualitative graphical structure and quantitative conditional probability assessments. As (possibly... View More

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